New efficient totally self-checking Berger code checkers

This paper presents a new method for designing totally self-checking (TSC) Berger code checkers for any number k of information bits, even for k"2r~1, taking into account realistic faults as stuck-at, transistor stuck-open, transistor stuck-on and resistive bridging faults. Doubleas well as single-output TSC checkers are given. The proposed single-output TSC Berger code checkers are the "rst in the open literature. The checkers designed following the proposed method are signi"cantly more e$cient, with respect to the required area and speed, than the corresponding already known from the open literature checkers. ( 1999 Elsevier Science B.V. All rights reserved.